Research

@inproceedings{park2025popecc,

title={PoP-ECC: Robust and Flexible Error Correction against Multi-Bit Upsets in DNN Accelerators},
author={Park, Taewon and Gorgin, Saeid and Kim, Dongwhee and Shin, Jaeho and Sullivan, Michael and Kim, Jungrae},
booktitle={2025 62th ACM/IEEE Design Automation Conference (DAC)},
pages={1--6},
year={2025},
organization={IEEE}
}

@inproceedings{lim2024selcc,

title={SELCC: Enhancing MLC Reliability and Endurance with Single-Cell Error Correction Codes},
author={Lim, Yujin and Kim, Dongwhee and Kim, Jungrae},
booktitle={2024 Design, Automation \& Test in Europe Conference \& Exhibition (DATE)},
pages={1--6},
year={2024},
organization={IEEE}
}

@inproceedings{lee2024agile,
      title={Agile-DRAM: Agile Trade-Offs in Memory Capacity, Latency, and Energy for Data Centers},
      author={Lee, Jaeyoon and Jung, Wonyeong and Kim, Dongwhee and Kim, Daero and Lee, Junseung and Kim, Jungrae},
      booktitle={2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA)},
      pages={1141--1153},
      year={2024},
      organization={IEEE}
    }

@inproceedings{kim2023unity,
  title={Unity ECC: Unified memory protection against bit and chip errors},
  author={Kim, Dongwhee and Lee, Jaeyoon and Jung, Wonyeong and Sullivan, Michael and Kim, Jungrae},
  booktitle={Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis},
  pages={1--16},
  year={2023}
}

@inproceedings{jung2023synergistic,

title={Synergistic Integration: An Optimal Combination of On-Die and Rank-Level ECC for Enhanced Reliability},
author={Jung, Wonyeong and Kim, Dongwhee and Kim, Jungrae},
booktitle={2023 20th International SoC Design Conference (ISOCC)},
pages={305--306},
year={2023},
organization={IEEE}
}

@inproceedings{lim2023scc,

title={SCC: Efficient Error Correction Codes for MLC PCM},
author={Lim, Yujin and Kim, Dongwhee and Kim, Jungrae},
booktitle={2023 20th International SoC Design Conference (ISOCC)},
pages={303--304},
year={2023},
organization={IEEE}
}

@inproceedings{kwon2023epa,
  title={EPA ECC: Error-Pattern-Aligned ECC for HBM2E},
  author={Kwon, Kiheon and Kim, Dongwhee and Park, Soyoung and Kim, Jungrae},
  booktitle={2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC)},
  pages={1--6},
  year={2023},
  organization={IEEE}
  }
  

@article{김동휘2023패킷,
  title={패킷 손실 환경에서 정확도 감소를 줄이는 심층 신경망 재학습 방법},
  author={김동휘 and 임유진 and 한승하 and 김정래},
  journal={Journal of KIISE},
  volume={50},
  number={3},
  pages={285--293},
  year={2023}
}
  

@inproceedings{kim2022yoco,
  title={YOCO: Unified and Efficient Memory Protection for High Bandwidth Memory},
  author={Kim, Dongwhee and Kim, Jungrae},
  booktitle={2022 19th International SoC Design Conference (ISOCC)},
  pages={37--38},
  year={2022},
  organization={IEEE}
}